报告题目：Scanning Microwave Impedance Microscopy
报 告 人：杨永亮 博士，PrimeNano公司总监
地 点：国家纳米科学中心 科研楼三层阶梯教室
邀 请 人：裘晓辉 研究员
Abstract: Scanning Microwave Impedance Microscopy (sMIM) is a near-field scanning probe microscopy technique to measure the local dielectric properties of materials. In this technique, a sharp cantilever is used as a microwave source to measure the electrical properties of materials at nanometer scale. sMIM is sensitive to the local capacitive and conductivity changes in a material making it an excellent method for characterizing wide range of materials (such as Insulators, semiconductors, 1D/2D, Ferroelectric materials). A great deal of cutting-edge physical investigations concerning fundamental mechanisms frequently involve electrical measurements at low temperatures and high magnetic fields. Low temperature sMIM provides a turnkey solution for frontier physics research (Quantum effects, Phase transitions, etc.) and novel materials studies (Topological insulators, Ferroelectrics, Manganates, etc.), enabling electrical characterization of materials at ultra- low temperatures and high magnetic field. In this talk, we will introduce the working principle of sMIM and its applications in materials and condense physics research. We will also have a quick introduction of available sMIM systems.
Dr. Yongliang Yang has been conducting research on scanning probe microscopy technology. He is leading the scanning microwave impedance microscopy research and development in PrimeNano.Before he joined PrimeNano in 2014 as a Research & Development scientist, he was a postdoc at Stanford University, developing scanning microwave impedance microscopy (sMIM) technology and studying electrical properties of materials with sMIM. Dr. Yang has a BS degree from Peking University and a PhD from Chinese Academic of Sciences. He is the inventor of four patents and the author of over 40 publications.